- Design for Manufacturability and Yield for Nano-Scale CMOS
- In the nano-era of CMOS the design and manufacturing communities are dealing with printing circuit artifacts that are less than half the wavelength of the light source used, with new materials, and with tighter pitch and higher aspect ratio metallurgies. This reality has resulted in three main manufacturability issues namely printability, planarization, and intra-die variability. Not addressing the fundamentals causing these three issues at...
http://www.amazon.com
- Pinnacle
- Pinnacle suite provides a high performance, highly scalable design-for-variability implementation solution for the largest Nanometer ICs.
http://www.mentor.com
- Design for Manufacturability
- In the past, products have been designed that could not be produced. Products have been released for production that could only be made to work in the model shop when prototypes were built and adjusted by highly skilled technicians. Effective product development must go beyond the traditional steps of acquiring and implementing product and process design technology as the solution. It must address management practices to consider customer...
http://www.npd-solutions.com/dfm.html
- Synopsys Announces Multi-Core Initiative to Accelerate Design Time-To-Results
- Synopsys, Inc. (NASDAQ: SNPS), a world leader in software and IP for semiconductor design and manufacturing, today announced its multi-core initiative to deploy advanced parallel, threaded and other optimized compute technologies across its Discovery Verification and Galaxy Design platforms, and Design for Manufacturing (DFM) solutions. The initiative aims to enable integrated circuit (IC) design companies to easily maximize the throughput...
http://synopsys.mediaroom.com
- Calibre nmDRC
- The industry standard for design rule checking.
http://www.mentor.com
- Calibre nmDRC
- Calibre® nmDRC is the solution to the physical verification challenges of nanometer design. Calibre nmDRC, with the new Hyperscaling processing architecture, produces best-in-class DRC run times with scalability to 100 CPUs. Full integration to popular layout environments and direct read capability allow designers to invoke DRC and debug results seamlessly within their design flow. Calibre nmDRC leverages the Calibre nm Platform to provide model-based verification and analysis, and visualization to guide the designer to the errors that truly impact yield. It is integrated with an innovative incremental verification and dynamic results viewing/debugging environment to further reduce DRC cycle time and dramatically improve designer productivity.
http://www.mentor.com
- Demystifying DFM
- Design for manufacturing (DFM) is about connections: connections within the design flow, connections within the manufacturing flow, and, most importantly, connections between design and manufacturing. These connections are required to address fundamental issues associated with yield loss in today’s leading-edge semiconductor products (see Figure 1) and are key to a robust DFM solution. The evolution of these connections closely tracks with...
http://www.future-fab.com
- Design for manufacturability (Integrated Circuits)
- Design for manufacturability (DFM) refers to the general engineering art of designing products in such a way that they are easy to manufacture. The basic idea exists in almost all engineering disciplines, but of course the details differ wildly depending on the manufacturing technology. Here are examples: Design for manufacturability for integrated circuits.
http://en.wikipedia.org/wiki/Design_for_manufacturability_%28IC%29
- Toppan Photomasks and Anchor Semiconductor Announce Advanced DFM Tool for Review
- Toppan Photomasks, Inc. today introduced a new DFM tool that will shorten cycle time and reduce risk in chip design through an exception dispositioning process for identifying and analyzing defects and design errors. The tool was developed in collaboration with Anchor Semiconductor Inc. and is an extension of that company’s NanoScope DFM platform. It allows designers and tapeout engineers to review “exceptions found during the...
http://www.anchorsemi.com/news/Toppan_NewsRelease_AnchorTool_F_2_27_08.pdf
- Calibre nmLVS
- Industry standard physical verification tool for layout versus schematic.
http://www.mentor.com
Explanation: these links are provided as part of our EE glossary project, which seeks to identify the most prominent keywords in embedded systems, embedded software, realtime and rtos, dsp (digital signal processing), system-on-a-chip, microprocessors and microcontrollers, and other constituent elements for embedded systems. While we seek to keep most of the links up-to-date, the user is refered to other primary electronic-based search sites such as: cera2.com, embedded.com, or EDN Magazine. If you have any suggestions of links or definitions, please email!
design for manufacturing